I have a proximity design based on the DA14580 tag application note.
It is currently undergoing BLE 4.1 certification testing and is failing the "Max Frequency Drift" test.
I have attached the report from the test house. I am confirming that the 16M crystal was "tuned" but at this stage this is our assumption according to the factory.
Can you shed any light on this, and is there anything we need to do?
regards
Anthony