Hi Dialog,
We currently use the Production Test Platform for DA14580. The programming and test sequence work fine for most of our applications, but we have one product variation that uses a buck converter to supply the DA14580 (Due to battery voltage). Due to the output capacitor for the buck converter we have more capacitance on the VBAT3V supply. In this case due to the extra capacitance we sometimes see a failure during programming when programming the external flash memory. The failure is DUT not present, but if removing the extra capacitor programming is ok. As a result I guess this may be a brown out voltage issue where the system voltage can't reduce sufficiently if re-applied during programming.
Is it possible to change the programming times or introduce a delay before reapplying the system voltage during programming when using the production programming platform? If possible could you give some instruction on how to do this.
Thanks
David

Hi scourfield,
Just checked with the hardware team, please try to add a 2k2 resistor between Vbat and gnd in order to reach POR level. This should solve your issue.
Thanks MT_dialog
Hi MT_dialog,
今天早上我已经测试了使用2 k2电阻器and it works fine.
Thanks
Hi scourfield,
Thanks for letting us now.
Best Regards MT_dialog